Jena
Germany
9
2025-12-04
The entities that hold a legal rights for patent applications filed by inventor Thaler Thomas:
Thomas Thaler from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
MASK METROLOGY MEASURING DEVICE AND METHOD FOR EXAMINING A PHOTOMASK
#2 | 2024-05-09APPARATUS AND METHOD FOR CHARACTERIZING A MICROLITHOGRAPHIC MASK
#3 | 2021-12-23Apparatus and method for characterizing a microlithographic mask
#4 | 2021-08-19Method for measuring photomasks
#5 | 2019-04-11Method for correcting the critical dimension uniformity of a photomask for semiconductor lithography
#6 | 2019-04-11Method and appliance for predicting the imaging result obtained with a mask when a lithography process is carried out
#7 | 2019-01-10Method and device for characterizing a mask for microlithography
#8 | 2018-04-05Method and device for determining an OPC model
#9 | 2015-07-16Emulation of reproduction of masks corrected by local density variations
2158041 ⎘