Inventor profile of:

Hideki Mori

City:

Kanagawa

Country:

Japan

Published Applications:

30

Last publication date:

2023-09-28

Top Assignees for applications by Hideki Mori

The entities that hold a legal rights for patent applications filed by inventor Mori Hideki:

Recent patent applications by Mori Hideki

Hideki Mori from Kanagawa, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2023-09-28
US20230307263A1
Electricity

PROCESSING LIQUID SUPPLY DEVICE, SUBSTRATE PROCESSING APPARATUS, AND METHOD FOR INSPECTING PROCESSING LIQUID SUPPLY DEVICE

#2 | 2023-09-14
US20230286013A1
Performing operations; transporting

Processing liquid supply device, substrate processing apparatus, and processing liquid supply method

#3 | 2017-07-20
US20170207212A1
Electricity

Electrostatic protective device and electrostatic protective circuit

#4 | 2013-05-02
US20130105911A1
Electricity

Semiconductor device

#5 | 2012-10-25
US20120267705A1
Electricity

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

#6 | 2012-10-04
US20120248541A1
Electricity

Semiconductor device

#7 | 2012-04-19
US20120094452A1
Electricity

Semiconductor device and manufacturing method of the same

#8 | 2010-12-09
US20100310152A1
Physics

Substrate surface inspecting apparatus and substrate surface inspecting method

#9 | 2010-12-09
US20100310150A1
Physics

Feature analyzing apparatus for a surface of an object

#10 | 2010-09-30
US20100246934A1
Electricity

Inspection device for disk-shaped substrate

#11 | 2010-09-30
US20100245810A1
Physics

Inspection method based on captured image and inspection device

#12 | 2010-07-15
US20100177953A1
Physics

Disc wafer inspecting device and inspecting method

#13 | 2010-03-25
US20100075442A1
Electricity

SEMICONDUCTOR WAFER PROCESSING APPARATUS, REFERENCE ANGULAR POSITION DETECTION METHOD, AND SEMICONDUCTOR WAFER

#14 | 2010-03-25
US20100074514A1
Physics

Wafer containing cassette inspection device and method

#15 | 2010-03-18
US20100066998A1
Physics

Surface inspection apparatus

#16 | 2010-03-04
US20100052045A1
Electricity

Semiconductor device and manufacturing method of the same

#17 | 2010-02-04
US20100026997A1
Physics

Apparatus and method for inspecting edge of semiconductor wafer

#18 | 2009-12-10
US20090304258A1
Physics

Visual Inspection System

#19 | 2009-07-09
US20090177415A1
Physics

Surface roughness inspection system

#20 | 2009-04-16
US20090097177A1
Electricity

Electrostatic discharge protection circuit

#21 | 2007-09-20
US20070216802A1
Electricity

Image processing apparatus for converting a lower resolution image into a higher resolution image using cyclic coefficients

#22 | 2007-09-20
US20070216801A1
Electricity

Image processing apparatus and method and program

#23 | 2007-04-19
US20070086118A1
Physics

Coil support structure and magnetic disk drive

#24 | 2006-11-23
US20060263986A1
Electricity

Semiconductor device

#25 | 2005-10-20
US20050230762A1
Electricity

Semiconductor device and method of fabricating same

#26 | 2005-09-15
US20050202623A1
Electricity

Semiconductor device and method of fabricating same

#27 | 2005-09-08
US20050194633A1
Electricity

Nonvolatile semiconductor memory device, charge injection method thereof and electronic apparatus

#28 | 2005-07-28
US20050161737A1
Electricity

Semiconductor device and manufacturing method thereof

#29 | 2005-06-07
US10474125
-

Semiconductor device and its manufacturing method

#30 | 2005-03-22
US10415256
-

Semiconductor device manufacturing method thereof

InventorID:

217613 ⎘