Niskayuna, New York
United States
29
2019-11-14
The entities that hold a legal rights for patent applications filed by inventor Plotnikov Yuri Alexeyevich:
Yuri Alexeyevich Plotnikov from Niskayuna, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Route examining system
#2 | 2019-02-28Route examining system and method
#3 | 2018-09-06SENSOR SYSTEM FOR BLOWOUT PREVENTER AND METHOD OF USE
#4 | 2018-03-08Route examining system
#5 | 2018-01-04System and method for detecting defects in a component
#6 | 2016-07-14Route examining system and method
#7 | 2016-07-07Route examining system
#8 | 2016-03-03Gas well integrity inspection system
#9 | 2015-12-24Route examining system and method
#10 | 2015-07-23Method and system for determination of pipe location in blowout preventers
#11 | 2015-07-02Route examination system and method
#12 | 2015-06-11System and method for inspection of components
#13 | 2015-02-26Route examining system and method
#14 | 2015-02-12Sensing magnetized portions of a wellhead system to monitor fatigue loading
#15 | 2014-11-13System and method for detection of nutritional parameters in food items
#16 | 2014-05-22Route examining system and method
#17 | 2013-05-02Eddy current array probe
#18 | 2012-10-25Systems and methods for object imaging
#19 | 2012-10-25Systems and Methods for Detecting Contraband
#20 | 2011-03-24Eddy current inspection system and method
#21 | 2009-03-26Electromagnetic resonance frequency inspection systems and methods
#22 | 2009-02-12Eddy current system and method for estimating material properties of parts
#23 | 2008-02-14Inspection systems and methods of operation
#24 | 2007-09-27EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS
#25 | 2006-06-22Eddy current probe and inspection method
#26 | 2006-06-22Eddy current array probes with enhanced drive fields
#27 | 2005-12-01Omnidirectional eddy current probe and inspection system
#28 | 2005-06-28Pulsed eddy current sensor probes and inspection methods
#29 | 2005-03-31Methods and apparatus for inspection utilizing pulsed eddy current
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