Inventor profile of:

Sven Barthel

City:

Chemnitz

Country:

Germany

Published Applications:

15

Last publication date:

2025-10-30

Top Assignees for applications by Sven Barthel

The entities that hold a legal rights for patent applications filed by inventor Barthel Sven:

Recent patent applications by Barthel Sven

Sven Barthel from Chemnitz, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-10-30
US20250334622A1
Physics

METHOD AND MEASUREMENT APPLICATION DEVICE

#2 | 2025-10-02
US20250309991A1
Electricity

MEASUREMENT APPLICATION DEVICE, SIGNAL FILTER DEVICE, AND METHOD

#3 | 2024-05-02
US20240146387A1
Electricity

COMPUTER IMPLEMENTED METHOD, MEASUREMENT APPLICATION DEVICE, AND NON-TRANSITORY COMPUTER READABLE MEDIUM

#4 | 2024-02-01
US20240036075A1
Physics

MEASUREMENT APPLICATION DEVICE AND METHOD

#5 | 2021-05-20
US20210149550A1
Physics

Display for an electronic measurement device and method to change a numerical value of an electronic measurement device

#6 | 2021-04-15
US20210109130A1
Physics

METHOD AND APPARATUS FOR CONTROLLING A MEASUREMENT DEVICE

#7 | 2020-10-29
US20200344585A1
Electricity

Measurement apparatus, measurement system and method for transferring data between a measurement apparatus and a portable device

#8 | 2020-10-29
US20200341620A1
Physics

Measurement apparatus and measurement method

#9 | 2020-10-29
US20200341052A1
Physics

Test system and test method for testing a device under test

#10 | 2020-10-29
US20200341033A1
Physics

Measurement apparatus and measurement method

#11 | 2020-10-01
US20200309846A1
Physics

Method and measuring apparatus for testing a device under test

#12 | 2019-07-11
US20190212369A1
Physics

Signal analyzing circuit and method for auto setting an oscilloscope

#13 | 2019-05-02
US20190128925A1
Physics

Method for analyzing a measured signal as well as measurement unit

#14 | 2019-03-14
US20190079115A1
Physics

Method for analyzing a measured signal and oscilloscope

#15 | 2018-06-07
US20180157383A1
Physics

Measuring device and configuration method

InventorID:

2208818 ⎘