Jong-Chern Lee

Stacked memory device and semiconductor memory system including the same

INTEGRATED CIRCUIT FOR DETECTING DEFECTS OF THROUGH CHIP VIA

Stack semiconductor apparatus having a through silicon via and method of fabricating the same

SEMICONDUCTOR APPARATUS AND METHOD FOR MANUFACTURING THE SAME

Temperature detection circuit of semiconductor memory apparatus

Semiconductor chip and semiconductor wafer

Semiconductor integrated circuit and semiconductor system including the same

Duty cycle correction circuit

Delay locked loop

Integrated circuit for detecting defects of through chip via

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT

Semiconductor memory device

Semiconductor system and device for identifying stacked chips and method thereof

SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING THE SAME

Open loop type delay locked loop and method for operating the same

Semiconductor integrated circuit having a multi-chip structure

Semiconductor chip and semiconductor wafer

Semiconductor memory device and method for operating the same

Delay locked loop and method for driving the same

Delay locked loop

APPARATUS AND METHOD FOR CONTROLLING OPERATION TIMING IN SEMICONDUCTOR MEMORY DEVICE

Semiconductor memory device and method for performing data compression test of the same

Command control circuit for semiconductor integrated device

Temperature detection circuit of semiconductor memory apparatus

Circuit and method for controlling read cycle

Delay circuit

Sense amplifier control signal generating circuit of semiconductor memory apparatus

Precharge circuit of semiconductor memory apparatus