Inventor profile of:

Gulbagh SINGH

City:

Hsinchu

Country:

Taiwan

Published Applications:

23

Last publication date:

2026-06-11

Top Assignees for applications by Gulbagh SINGH

The entities that hold a legal rights for patent applications filed by inventor SINGH Gulbagh:

Recent patent applications by SINGH Gulbagh

Gulbagh SINGH from Hsinchu, TW has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-11
US20260164683A1
Electricity

METAL-INSULATOR-METAL (MIM) CAPACITOR AND METHOD OF MAKING SAME

#2 | 2025-11-13
US20250351358A1
Electricity

MEMORY DEVICE WITH IMPROVED DATA RETENTION

#3 | 2025-04-17
US20250126833A1
Electricity

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

#4 | 2024-02-22
US20240063158A1
Electricity

METHOD OF MAKING SEMICONDUCTOR STRUCTURE INCLUDING BUFFER LAYER

#5 | 2023-11-23
US20230378347A1
Electricity

Semiconductor structure and method for manufacturing the same

#6 | 2023-01-12
US20230011605A1
Electricity

METAL-INSULATOR-METAL (MIM) CAPACITOR AND METHOD OF MAKING SAME

#7 | 2022-12-29
US20220415916A1
Electricity

MEMORY DEVICE WITH IMPROVED DATA RETENTION

#8 | 2022-08-04
US20220246756A1
Electricity

Semiconductor structure and method for manufacturing the same

#9 | 2022-06-30
US20220208704A1
Electricity

Semiconductor structure including buffer layer

#10 | 2021-10-21
US20210328031A9
Electricity

Structures and methods for noise isolation in semiconductor devices

#11 | 2021-10-21
US20210328009A1
Electricity

Semiconductor device with air-void in spacer

#12 | 2021-10-21
US20210327902A1
Electricity

Semiconductor wafer with devices having different top layer thicknesses

#13 | 2020-10-08
US20200321296A1
Electricity

Method of designing a layout, method of making a semiconductor structure and semiconductor structure

#14 | 2020-09-17
US20200295046A1
Electricity

Method for forming a bulk semiconductor substrate configured to exhibit soi behavior

#15 | 2020-08-06
US20200251554A1
Electricity

Isolation regions for reduced junction leakage

#16 | 2020-04-30
US20200135875A1
Electricity

Structures and methods for noise isolation in semiconductor devices

#17 | 2020-02-20
US20200058736A1
Electricity

Isolation regions for reduced junction leakage

#18 | 2020-01-02
US20200006386A1
Electricity

Bulk semiconductor substrate configured to exhibit semiconductor-on-insulator behavior

#19 | 2019-12-26
US20190393078A1
Electricity

Shallow trench isolation for integrated circuits

#20 | 2019-05-30
US20190164987A1
Electricity

Memory device with improved data retention

#21 | 2019-05-23
US20190157407A1
Electricity

Structures and methods for noise isolation in semiconductor devices

#22 | 2019-05-16
US20190148322A1
Electricity

Semiconductor device with post passivation structure

#23 | 2018-11-01
US20180315723A1
Electricity

Semiconductor device with post passivation structure and fabrication method therefor

InventorID:

2339132 ⎘