Uwe HEIKE

City:

Rellingen

Country:

Germany

Published Applications:

Last publication date:

2018-11-08

Recent patent applications by HEIKE Uwe

Uwe HEIKE from Rellingen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

ANTI-SCATTER FILTER FOR AN X-RAY INSPECTION SYSTEM, X-RAY INSPECTION SYSTEM AND OPERATION OF AN X-RAY INSPECTION SYSTEM

Method of determining and correcting non-linear detector pixels

InventorID:

2345101 ⎘