Jericho, Vermont
United States
18
2026-03-05
The entities that hold a legal rights for patent applications filed by inventor Wagner Grant:
Grant Wagner from Jericho, US has applied for patents for these inventions. The list has both pending applications and granted patents:
FINE-PITCH PROBING SHIELD
#2 | 2026-02-05SILICON INTERPOSER WITH INTEGRATED FINE-PITCH WAFER TEST PROBES
#3 | 2024-06-27CLUSTERING FINE PITCH MICRO-BUMPS FOR PACKAGING AND TEST
#4 | 2024-06-06Clustered rigid wafer test probe
#5 | 2023-06-01Compliant wafer probe assembly
#6 | 2023-03-23Wafer probe with elastomer support
#7 | 2021-03-18Interconnect and tuning thereof
#8 | 2021-03-18Compliant organic substrate assembly for rigid probes
#9 | 2020-12-10Fluidized alignment of a semiconductor die to a test probe
#10 | 2020-09-17Electrochemical cleaning of test probes
#11 | 2020-07-02Integrated circuit tester probe contact liner
#12 | 2019-11-21Integrated circuit tester probe contact liner
#13 | 2019-07-25PROCESSES FOR FABRICATING LOW-FORCE WAFER TEST PROBES AND THEIR STRUCTURES
#14 | 2018-12-13PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TESTING
#15 | 2018-12-13PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TESTING
#16 | 2018-12-13PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TESTING
#17 | 2018-11-29PROCESSES FOR FABRICATING LOW-FORCE WAFER TEST PROBES AND THEIR STRUCTURES
#18 | 2018-11-29Low-force wafer test probes
2359571 ⎘