Nara
Japan
17
2024-07-04
The entities that hold a legal rights for patent applications filed by inventor IRIE Yousuke:
Yousuke IRIE from Nara, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT DETECTION METHOD, AND DEFECT DETECTION DEVICE
#2 | 2022-06-16Stress distribution image processing device
#3 | 2022-06-09Stress analysis device
#4 | 2022-03-17Stress analysis device for moving body
#5 | 2021-12-30Stress properties measurement method, device, and system correlated based on stress gradients on multiple regions
#6 | 2021-11-25Thickness measurement method, thickness measurement device, defect detection method, and defect detection device
#7 | 2021-04-08Stress distribution measurement method and stress distribution measurement system
#8 | 2021-02-18Stress measurement device, stress measurement system, and stress measurement method
#9 | 2019-11-21Stress measurement method, stress measurement device, and stress measurement system
#10 | 2019-10-10Fatigue limit stress specification system, fatigue limit stress specification device, and fatigue limit stress specification method
#11 | 2019-04-11Stress measurement device, stress measurement system, and stress measurement method
#12 | 2018-12-27Thickness measurement method, thickness measurement device, defect detection method, and defect detection device
#13 | 2018-12-06Stress distribution measurement method and stress distribution measurement system
#14 | 2005-09-15Cleaning method and cleaning apparatus
#15 | 2005-09-13Head support mechanism, information recording/reproducing apparatus, and method of manufacturing head support mechanism
#16 | 2005-06-07Piezoelectric element, actuator, and inkjet head
#17 | 2005-05-05Optical switch and production method therefor, information transmission device using it
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