Tokyo
Japan
9
2024-05-23
The entities that hold a legal rights for patent applications filed by inventor Toraya Hideo:
Hideo Toraya from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLINITY MEASUREMENT METHOD, AND INFORMATION STORAGE MEDIUM
#2 | 2023-09-07DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND INFORMATION STORAGE MEDIUM
#3 | 2022-12-08Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium
#4 | 2022-06-16METHOD AND DEVICE FOR ANALYZING DIFFRACTIONPATTERN OF MIXTURE, AND INFORMATION STORAGE MEDIUM
#5 | 2021-01-21Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline Phases
#6 | 2020-06-04Quantitative phase analysis device, quantitative phase analysis method, and non-transitory computer-readable storage medium storing quantitative phase analysis program
#7 | 2018-12-20Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program
#8 | 2010-09-30X-ray diffraction method and X-ray diffraction apparatus
#9 | 2009-04-02X-ray diffraction apparatus and X-ray diffraction method
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