Takuya LEE

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2019-01-03

Top Assignees for applications by Takuya LEE

The entities that hold a legal rights for patent applications filed by inventor LEE Takuya:

Takuya LEE from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Multiple core analysis mode for defect analysis

Semiconductor device

SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE

InventorID:

2378858 ⎘