Mathias Meyer

City:

Wroclaw

Country:

Poland

Published Applications:

Last publication date:

2019-10-24

Top Assignees for applications by Mathias Meyer

The entities that hold a legal rights for patent applications filed by inventor Meyer Mathias:

Mathias Meyer from Wroclaw, PL has applied for patents for these inventions. The list has both pending applications and granted patents:

Technique for processing X-ray diffraction data

X-ray detector and technique of controlling the X-ray detector

InventorID:

2398689 ⎘