Munchen
Germany
23
2026-03-19
The entities that hold a legal rights for patent applications filed by inventor Breuer John:
John Breuer from Munchen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING ASTIGMATISM AND NUMERICAL APERTURE
#2 | 2026-03-05APPARATUS FOR A CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVICE, METHOD OF ANALYZING A MAGNETIC LENS FOR A CHARGED PARTICLE BEAM DEVICE, AND NON-TRANSITORY MEDIUM
#3 | 2025-05-01METHOD OF CHARACTERIZING A DETECTION PATH OF A CHARGED PARTICLE BEAM AND A CHARGED PARTICLE MIRROR
#4 | 2025-01-30METHOD OF DETERMINING A BEAM CONVERGENCE OF A CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM SYSTEM
#5 | 2024-11-07METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM IMAGING DEVICE
#6 | 2024-10-24ABERRATION CORRECTOR, A CHARGED PARTICLE BEAM APPARATUS, A METHOD OF ALIGNING AN ABERRATION CORRECTOR AND A METHOD OF CORRECTING ABERRATION OF A CHARGED PARTICLE BEAM
#7 | 2024-08-15METHOD OF FORMING A MULTIPOLE DEVICE, METHOD OF INFLUENCING AN ELECTRON BEAM, AND MULTIPOLE DEVICE
#8 | 2024-07-04CHARGED PARTICLE BEAM COLUMN, CHARGED PARTICLE BEAM CHROMATIC ABERRATION CORRECTOR, AND METHOD OF CORRECTING CHARGED PARTICLE BEAM CHROMATIC ABERRATION
#9 | 2024-05-23CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION OF A CHARGED PARTICLE BEAM, AND METHOD THEREOF
#10 | 2024-04-18METHOD OF DETERMINING A BRIGHTNESS OF A CHARGED PARTICLE BEAM, METHOD OF DETERMINING A SIZE OF A SOURCE OF THE CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM IMAGING DEVICE
#11 | 2023-11-02Methods of determining aberrations of a charged particle beam, and charged particle beam system
#12 | 2023-04-13Method of determining the beam convergence of a focused charged particle beam, and charged particle beam system
#13 | 2023-04-13Methods of determining aberrations of a charged particle beam, and charged particle beam system
#14 | 2022-11-24Aberration corrector and method of aligning aberration corrector
#15 | 2022-11-10Charged particle beam apparatus and method of controlling sample charge
#16 | 2022-06-30Primary charged particle beam current measurement
#17 | 2021-08-19Charged particle beam device with interferometer for height measurement
#18 | 2020-12-03Charged particle beam device, objective lens module, electrode device, and method of inspecting a specimen
#19 | 2020-01-23Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets
#20 | 2019-01-10Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets
#21 | 2017-07-04Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam device
#22 | 2016-10-18Beam separator device, charged particle beam device and methods of operating thereof
#23 | 2016-05-24Charged particle beam device, beam deflector device and methods of operating thereof
2399813 ⎘