Hiroko TAKEUCHI

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2019-01-31

Top Assignees for applications by Hiroko TAKEUCHI

The entities that hold a legal rights for patent applications filed by inventor TAKEUCHI Hiroko:

Hiroko TAKEUCHI from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Charged particle beam apparatus using focus evaluation values for pattern length measurement

InventorID:

2418015 ⎘