Inventor profile of:

Uwe Schellhorn

City:

Aalen

Country:

Germany

Published Applications:

13

Last publication date:

2026-05-07

Top Assignees for applications by Uwe Schellhorn

The entities that hold a legal rights for patent applications filed by inventor Schellhorn Uwe:

Recent patent applications by Schellhorn Uwe

Uwe Schellhorn from Aalen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-07
US20260125304A1
Chemistry; metallurgy

APPARATUS AND METHOD FOR THERMALLY TREATING A BODY TO BE THERMALLY TREATED

#2 | 2014-01-23
US20140022524A1
Physics

Device and method for the optical measurement of an optical system by using an immersion fluid

#3 | 2013-05-16
US20130120820A1
Physics

Beam control apparatus for an illumination beam and metrology system comprising an optical system containing such a beam control apparatus

#4 | 2012-05-10
US20120113429A1
Physics

DEVICE AND METHOD FOR THE OPTICAL MEASUREMENT OF AN OPTICAL SYSTEM BY USING AN IMMERSION FLUID

#5 | 2010-09-23
US20100241384A1
Physics

Method for calibrating a specimen stage of a metrology system and metrology system comprising a specimen stage

#6 | 2010-06-17
US20100153059A1
Physics

APPARATUS AND METHOD FOR MEASURING THE POSITIONS OF MARKS ON A MASK

#7 | 2010-04-22
US20100097608A1
Physics

Method for determination of residual errors

#8 | 2009-10-15
US20090257049A1
Physics

Device and method for the optical measurement of an optical system by using an immersion fluid

#9 | 2009-01-22
US20090021726A1
Physics

DEVICE AND METHOD FOR THE OPTICAL MEASUREMENT OF AN OPTICAL SYSTEM BY USING AN IMMERSION FLUID

#10 | 2006-10-10
US10697239
-

Phase shifting wavefront interference method

#11 | 2006-01-12
US20060007429A1
Physics

Method for determining distortion and/or image surface

#12 | 2005-11-03
US20050243328A1
Physics

Device and method for the optical measurement of an optical system by using an immersion fluid

#13 | 2005-06-09
US20050122506A1
Physics

Moire method and measuring system for measuring the distortion of an optical imaging system

InventorID:

244571 ⎘