Hiroshi OHNO

City:

Chuo

Country:

Japan

Published Applications:

Last publication date:

2023-04-20

Top Assignees for applications by Hiroshi OHNO

The entities that hold a legal rights for patent applications filed by inventor OHNO Hiroshi:

Hiroshi OHNO from Chuo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Processing device, measurement device, and measurement method

SURFACE-EMITTING SEMICONDUCTOR LIGHT-EMITTING DEVICE

Non-contact non-destructive inspection system, signal processing device, and non-contact non-destructive inspection method

Nozzle and additive manufacturing apparatus

Measurement method and measurement apparatus

NOZZLE AND ADDITIVE MANUFACTURING APPARATUS

Nozzle and additive manufacturing apparatus

Nozzle, processing apparatus, and additive manufacturing apparatus

InventorID:

2457700 ⎘