Yasuhiro YOSHITAKE

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2020-06-11

Top Assignees for applications by Yasuhiro YOSHITAKE

The entities that hold a legal rights for patent applications filed by inventor YOSHITAKE Yasuhiro:

Yasuhiro YOSHITAKE from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Defect inspection apparatus and pattern chip

Defect inspection device, pattern chip, and defect inspection method

InventorID:

2476755 ⎘