Jonas Hiller

City:

Berlin

Country:

Germany

Published Applications:

Last publication date:

2019-06-06

Top Assignees for applications by Jonas Hiller

The entities that hold a legal rights for patent applications filed by inventor Hiller Jonas:

Jonas Hiller from Berlin, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope

InventorID:

2522548 ⎘