Jong Sig LEE

City:

Gyeonggi-do

Country:

South Korea

Published Applications:

Last publication date:

2022-05-05

Top Assignees for applications by Jong Sig LEE

The entities that hold a legal rights for patent applications filed by inventor LEE Jong Sig:

Jong Sig LEE from Gyeonggi-do, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE TEMPERATURE CONTROL UNIT AND ANALYZING METHOD USING THE SAME

Analysis apparatus interlocking in-situ x-ray diffraction and potentiostat and analyzing methods using the same

X-ray diffractometer and method of correcting measurement position thereof

Micro-diffraction system and method of analyzing sample using the same

InventorID:

2586684 ⎘