Ray Leerentveld

City:

Palgrave

Country:

Canada

Published Applications:

Last publication date:

2024-02-29

Top Assignees for applications by Ray Leerentveld

The entities that hold a legal rights for patent applications filed by inventor Leerentveld Ray:

Ray Leerentveld from Palgrave, CA has applied for patents for these inventions. The list has both pending applications and granted patents:

PIXEL MEASUREMENT THROUGH DATA LINE

PIXEL MEASUREMENT THROUGH DATA LINE

Pixel measurement through data line

Pixel measurement through data line

Method and apparatus for optical inspection of a display

Moiré suppression method and apparatus

InventorID:

2588111 ⎘