Eindhoven
Netherlands
26
2025-05-15
The entities that hold a legal rights for patent applications filed by inventor Henstra Alexander:
Alexander Henstra from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
BIFOCAL ELECTRON MICROSCOPE
#2 | 2025-01-23FIB AND SEM RESOLUTION ENHANCEMENT USING ASYMMETRIC PROBE DECONVOLUTION
#3 | 2024-08-15Bifocal electron microscope
#4 | 2024-07-25TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED PARTICLES SOURCES
#5 | 2023-12-28FOCUSED ION BEAM SYSTEM AND METHOD
#6 | 2023-07-06ELECTROSTATIC MIRROR CHROMATIC ABERRATION CORRECTORS
#7 | 2023-06-29ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION
#8 | 2023-02-09System and method for reducing the charging effect in a transmission electron microscope system
#9 | 2023-01-05Energy spectrometer with dynamic focus
#10 | 2023-01-05Electron diffraction holography
#11 | 2022-12-08Reduction of thermal magnetic field noise in TEM corrector systems
#12 | 2022-10-06Methods and systems for acquiring three-dimensional electron diffraction data
#13 | 2022-06-30Reduction of thermal magnetic field noise in TEM corrector systems
#14 | 2022-06-23Magnetic field free sample plane for charged particle microscope
#15 | 2022-02-01Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systems
#16 | 2021-12-16Dual beam microscope system for imaging during sample processing
#17 | 2021-09-30Simultaneous TEM and STEM microscope
#18 | 2021-09-30Methods and systems for acquiring 3D diffraction data
#19 | 2021-09-30DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE
#20 | 2021-09-30Electron diffraction holography
#21 | 2021-05-27Sixth-order and above corrected STEM multipole correctors
#22 | 2020-11-03Corrector transfer optics for Lorentz EM
#23 | 2020-04-16CHARGED PARTICLE MICROSCOPE, AND METHOD FOR ADJUSTING A CHARGED PARTICLE MICROSCOPE
#24 | 2020-01-09ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION
#25 | 2006-10-05Particle-optical appliance provided with aberration-correcting means
#26 | 2005-08-18Particle source with selectable beam current and energy spread
2612080 ⎘