Mito
Japan
23
2015-04-16
The entities that hold a legal rights for patent applications filed by inventor Shimura Kei:
Kei Shimura from Mito, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Defect inspection apparatus and defect inspection method
#2 | 2014-02-13Defect inspection apparatus and defect inspection method
#3 | 2013-12-05Device for detecting foreign matter and method for detecting foreign matter
#4 | 2013-06-13INSPECTION APPARATUS AND INSPECTION METHOD
#5 | 2013-04-25Inspection apparatus and inspection method
#6 | 2013-04-11FAR INFRARED IMAGING DEVICE AND IMAGING METHOD USING SAME
#7 | 2013-01-10Defect inspecting device and defect inspecting method
#8 | 2012-10-25Pattern defect inspection apparatus and method
#9 | 2012-05-10Method and apparatus for visual inspection
#10 | 2011-09-15PATTERN DEFECT INSPECTING APPARATUS AND METHOD
#11 | 2011-06-16APPARATUS AND METHOD FOR INSPECTING AN OBJECT SURFACE DEFECT
#12 | 2010-09-23Method and apparatus for visual inspection
#13 | 2010-09-09Pattern defect inspection apparatus and method
#14 | 2010-08-05Method and apparatus for visual inspection
#15 | 2010-04-29Defect inspection apparatus and defect inspection method
#16 | 2009-06-25Inspection apparatus and inspection method
#17 | 2008-11-06Pattern defect inspection apparatus and method
#18 | 2008-03-06Defect inspection apparatus and defect inspection method
#19 | 2007-01-25Method and apparatus for visual inspection
#20 | 2006-05-04Apparatus for visual inspection
#21 | 2006-04-13Method and apparatus for inspecting defects
#22 | 2006-04-06Image viewing method for microstructures and defect inspection system using it
#23 | 2005-05-05Method and apparatus for visual inspection
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