Inventor profile of:

Yosuke KOJIMA

City:

Tokyo

Country:

Japan

Published Applications:

20

Last publication date:

2025-05-08

Top Assignees for applications by Yosuke KOJIMA

The entities that hold a legal rights for patent applications filed by inventor KOJIMA Yosuke:

Recent patent applications by KOJIMA Yosuke

Yosuke KOJIMA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-05-08
US20250147408A1
Physics

PHASE SHIFT MASK AND METHOD FOR MANUFACTURING PHASE SHIFT MASK

#2 | 2025-04-24
US20250130488A1
Physics

PHOTOMASK BLANK, PHOTOMASK, AND METHOD FOR MANUFACTURING PHOTOMASK

#3 | 2024-12-19
US20240419064A1
Physics

PHASE SHIFT MASK AND METHOD FOR MANUFACTURING PHASE SHIFT MASK

#4 | 2024-09-12
US20240302732A1
Physics

PHASE SHIFT MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING PHASE SHIFT MASK

#5 | 2024-05-09
US20240152045A1
Physics

PHASE SHIFT MASK BLANK, PHASE SHIFT MASK, METHOD FOR MANUFACTURING PHASE SHIFT MASK, AND METHOD FOR MODIFYING PHASE SHIFT MASK

#6 | 2023-10-19
US20230333461A1
Physics

PHASE SHIFT MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING PHASE SHIFT MASK

#7 | 2023-03-09
US20230070724A1
Physics

REFLECTIVE MASK BLANK, REFLECTIVE MASK, REFLECTIVE MASK MANUFACTURING METHOD, AND REFLECTIVE MASK CORRECTION METHOD

#8 | 2021-09-23
US20210295964A1
Physics

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND NON-TRANSITORY STORAGE MEDIUM

#9 | 2020-01-09
US20200012185A1
Physics

Photomask blank, photomask, and photomask manufacturing method

#10 | 2013-05-23
US20130130160A1
Physics

Light pattern exposure method, photomask, and photomask blank

#11 | 2013-05-23
US20130130159A1
Physics

Light pattern exposure method, halftone phase shift mask, and halftone phase shift mask blank

#12 | 2012-10-04
US20120251930A1
Physics

Photomask blank and method for manufacturing photomask

#13 | 2012-08-23
US20120212514A1
Physics

Apparatus, a method and a program thereof

#14 | 2012-03-15
US20120064438A1
Physics

Photomask blank and making method, photomask, light pattern exposure method, and design method of transition metal/silicon base material film

#15 | 2010-10-14
US20100261101A1
Physics

Photomask blank and photomask

#16 | 2010-10-14
US20100261100A1
Physics

Photomask blank and photomask

#17 | 2010-10-14
US20100261099A1
Physics

Photomask blank and photomask making method

#18 | 2007-11-22
US20070269726A1
Physics

Phase-shift mask, manufacturing method thereof and manufacturing method of semiconductor element

#19 | 2007-09-13
US20070212619A1
Physics

Photomask blank and photomask making method

#20 | 2007-09-13
US20070212618A1
Physics

Photomask blank and photomask

InventorID:

261883 ⎘