Goleta, California
United States
8
2025-05-08
The entities that hold a legal rights for patent applications filed by inventor Ruiter Anthonius:
Anthonius Ruiter from Goleta, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)
#2 | 2024-05-30Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#3 | 2023-08-03Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#4 | 2022-08-11Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#5 | 2021-08-05Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#6 | 2020-05-28Low drift system for a metrology instrument
#7 | 2020-02-06Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#8 | 2011-09-29Low drift scanning probe microscope
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