Albert Dekker

City:

Delft

Country:

Netherlands

Published Applications:

Last publication date:

2023-05-25

Top Assignees for applications by Albert Dekker

The entities that hold a legal rights for patent applications filed by inventor Dekker Albert:

Albert Dekker from Delft, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

Probe, method of manufacturing a probe and scanning probe microscopy system

Probe chip, scan head, scanning probe microscopy device and use of a probe chip

Z-position motion stage for use in a scanning probe microscopy system, scan head and method of manufacturing

High-precision linear actuator

Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample

High-precision scanning device

SCANNING PROBE MICROSCOPY SYSTEM, AND METHOD FOR MOUNTING AND DEMOUNTING A PROBE THEREIN

InventorID:

2702128 ⎘