Darryl Barlett

City:

Dexter, Michigan

Country:

United States

Published Applications:

Last publication date:

2013-12-05

Top Assignees for applications by Darryl Barlett

The entities that hold a legal rights for patent applications filed by inventor Barlett Darryl:

Darryl Barlett from Dexter, US has applied for patents for these inventions. The list has both pending applications and granted patents:

REAL-TIME TEMPERATURE, OPTICAL BAND GAP, FILM THICKNESS, AND SURFACE ROUGHNESS MEASUREMENT FOR THIN FILMS APPLIED TO TRANSPARENT SUBSTRATES

Non-contact, optical sensor for synchronizing to free rotating sample platens with asymmetry

Thin film temperature measurement using optical absorption edge wavelength

Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing

Blackbody fitting for temperature determination

Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing

Curvature/tilt metrology tool with closed loop feedback control

Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing

InventorID:

272105 ⎘