Eindhoven
Netherlands
20
2026-03-26
The entities that hold a legal rights for patent applications filed by inventor Deng Yuchen:
Yuchen Deng from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
ACQUIRING AND ENCODING ELECTRON MICROSCOPE GENERATED IMAGES
#2 | 2025-12-11AREA SELECTION IN CHARGED PARTICLE MICROSCOPE IMAGING
#3 | 2025-05-15BIFOCAL ELECTRON MICROSCOPE
#4 | 2025-04-17CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTICLE BEAM MICROSCOPY
#5 | 2024-08-15Bifocal electron microscope
#6 | 2024-04-18METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE
#7 | 2024-02-29Automated Selection And Model Training For Charged Particle Microscope Imaging
#8 | 2023-08-03AUTOMATIC PARTICLE BEAM FOCUSING
#9 | 2023-07-27Auto-tuning stage settling time with feedback in charged particle microscopy
#10 | 2023-06-01Systems and methods for quantum computing based sample analysis
#11 | 2023-02-09System and method for reducing the charging effect in a transmission electron microscope system
#12 | 2023-01-05Electron diffraction holography
#13 | 2022-12-29AREA SELECTION IN CHARGED PARTICLE MICROSCOPE IMAGING
#14 | 2021-12-16Dual beam microscope system for imaging during sample processing
#15 | 2021-09-30Simultaneous TEM and STEM microscope
#16 | 2021-09-30Methods and systems for acquiring 3D diffraction data
#17 | 2021-09-30DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE
#18 | 2021-09-30Electron diffraction holography
#19 | 2021-02-18Systems and methods for quantum computing based sample analysis
#20 | 2020-05-28Method of imaging a sample using an electron microscope
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