Yunjun LU

City:

Shanghai

Country:

China

Published Applications:

Last publication date:

2022-12-29

Top Assignees for applications by Yunjun LU

The entities that hold a legal rights for patent applications filed by inventor LU Yunjun:

Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences 7 Shanghai, China
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences 1 Shanghai, China

Recent patent applications by LU Yunjun

Yunjun LU from Shanghai, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-12-29

US20220412720A1

Physics

Method for compensation during the process of wavefront reconstruction in grating-based lateral shearing interferometry

#2 | 2022-11-17

US20220365441A1

Physics

Multi-channel device and method for measuring distortion and magnification of objective lens

#3 | 2022-09-22

US20220299402A1

Physics

Apparatus and method for detecting wavefront aberration of objective lens

#4 | 2022-03-10

US20220074793A1

Physics

Method for high-accuracy wavefront measurement base on grating shearing interferometry

#5 | 2021-07-08

US20210208005A1

Physics

Light intensity fluctuation-insensitive projection objective wave aberration detection device and detection method thereof

#6 | 2021-01-28

US20210026250A1

Physics

Device and method for detecting projection objective wave-front aberration

#7 | 2020-09-17

US20200292384A1

Physics

Method for detecting wavefront aberration for optical imaging system based on grating shearing interferometer

#8 | 2020-09-17

US20200292296A1

Physics

Method for wavefront measurement of optical imaging system based on grating shearing interferometry

#9 | 2017-05-23

US14986593

Physics

Device for measuring point diffraction interferometric wavefront aberration and method for detecting wave aberration

InventorID:

2850934 ⎘