Austin, Texas
United States
11
2025-06-19
The entities that hold a legal rights for patent applications filed by inventor Rafferty Tom H.:
Tom H. Rafferty from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD OF MEASURING EDGE ECCENTRICITY WHILE WAFER IS ON PRE-ALIGNER
#2 | 2023-02-02DEVICES, SYSTEMS, AND METHODS FOR THE TRANSFORMATION AND CROPPING OF DROP PATTERNS
#3 | 2020-09-17Method of separating a template from a shaped film on a substrate
#4 | 2019-04-25Drop placement evaluation
#5 | 2010-02-18Interferometric analysis method for the manufacture of nano-scale devices
#6 | 2009-07-02Enhanced multi channel alignment
#7 | 2009-06-11Alignment Using Moire Patterns
#8 | 2009-06-11Spatial Phase Feature Location
#9 | 2007-10-04Enhanced Multi Channel Alignment
#10 | 2006-06-15Interferometric analysis for the manufacture of nano-scale devices
#11 | 2006-06-01Interferometric analysis method for the manufacture of nano-scale devices
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