Boise, Idaho
United States
17
2025-02-27
The entities that hold a legal rights for patent applications filed by inventor Lyonsmith Shawn D.:
Shawn D. Lyonsmith from Boise, US has applied for patents for these inventions. The list has both pending applications and granted patents:
MEMORY DEVICE INCLUDING MULTIPLE DECKS OF MEMORY CELLS AND PILLARS EXTENDING THROUGH THE DECKS
#2 | 2024-05-09SYSTEM FOR PREDICTING PROPERTIES OF STRUCTURES, IMAGER SYSTEM, AND RELATED METHODS
#3 | 2023-04-20Memory device including multiple decks of memory cells and pillars extending through the decks
#4 | 2023-02-09SEMICONDUCTOR DEVICE HAVING A STACK OF DATA LINES WITH CONDUCTIVE STRUCTURES ON BOTH SIDES THEREOF
#5 | 2022-03-03Memory device including multiple decks of memory cells and pillars extending through the decks
#6 | 2021-04-29Semiconductor device having a stack of data lines with conductive structures on both sides thereof
#7 | 2021-03-25System for predicting properties of structures, imager system, and related methods
#8 | 2020-02-13System for predicting properties of structures, imager system, and related methods
#9 | 2019-11-21Non-contact electron beam probing techniques and related structures
#10 | 2019-11-07Non-contact measurement of memory cell threshold voltage
#11 | 2019-06-20Non-contact measurement of memory cell threshold voltage
#12 | 2019-06-20Non-contact electron beam probing techniques and related structures
#13 | 2013-01-10Method of reducing damage to an electron beam inspected semiconductor substrate, and methods of inspecting a semiconductor substrate
#14 | 2010-12-23Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging
#15 | 2008-03-27Method of reducing electron beam damage on post W-CMP wafers
#16 | 2008-01-10Electron induced chemical etching/deposition for enhanced detection of surface defects
#17 | 2005-07-19Biasable isolation regions using epitaxially grown silicon between the isolation regions
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