Inventor profile of:

Thomas KENT

City:

Columbus, Ohio

Country:

United States

Published Applications:

14

Last publication date:

2026-01-15

Top Assignees for applications by Thomas KENT

The entities that hold a legal rights for patent applications filed by inventor KENT Thomas:

Recent patent applications by KENT Thomas

Thomas KENT from Columbus, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-01-15
US20260018471A1
Electricity

ASSEMBLY AND METHOD FOR PERFORMING IN-SITU ENDPOINT DETECTION WHEN BACKSIDE MILLING SILICON BASED DEVICES

#2 | 2025-09-18
US20250290883A1
Physics

SYSTEMS AND METHODS FOR MEASURING UNIQUE MICROELECTRONIC ELECTROMAGNETIC SIGNATURES

#3 | 2025-09-16
US17329370
Physics

Systems and methods for measuring unique microelectronic electromagnetic signatures

#4 | 2025-06-19
US20250199061A1
Physics

Method of Identifying Vulnerable Regions in an Integrated Circuit

#5 | 2025-03-13
US20250086751A1
Physics

MULTIMODAL INSPECTION SYSTEM

#6 | 2024-07-11
US20240233407A9
Physics

SYSTEMS AND METHODS FOR PRINTED CIRCUIT BOARD NETLIST EXTRACTION FROM MULTIMODAL IMAGERY

#7 | 2024-04-25
US20240135732A1
Physics

SYSTEMS AND METHODS FOR PRINTED CIRCUIT BOARD NETLIST EXTRACTION FROM MULTIMODAL IMAGERY

#8 | 2024-02-22
US20240062330A1
Physics

Multimodal inspection system

#9 | 2023-06-22
US20230194599A1
Physics

TECHNOLOGIES FOR VERIFYING AND VALIDATING ELECTRONIC DEVICES USING ELECTROLUMINESCENCE

#10 | 2023-05-04
US20230138247A1
Physics

Method of identifying vulnerable regions in an integrated circuit

#11 | 2023-02-09
US20230044517A1
Physics

DIGITAL CIRCUIT REPRESENTATION USING A SPATIALLY RESOLVED NETLIST

#12 | 2022-07-14
US20220223484A1
Electricity

Assembly and Method for Performing In-Situ Endpoint Detection When Backside Milling Silicon Based Devices

#13 | 2022-01-20
US20220020114A1
Physics

Multimodal inspection system

#14 | 2020-11-26
US20200373211A1
Electricity

Assembly and method for performing in-situ endpoint detection when backside milling silicon based devices

InventorID:

2919342 ⎘