Lior KATZ

City:

Jerusalem

Country:

Israel

Published Applications:

Last publication date:

2025-08-14

Top Assignees for applications by Lior KATZ

The entities that hold a legal rights for patent applications filed by inventor KATZ Lior:

Lior KATZ from Jerusalem, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

TRAINING AND USING A NEURAL NETWORK FOR DEFECT DETECTION

MACHINE LEARNING BASED DEFECT EXAMINATION AND RANKING FOR SEMICONDUCTOR SPECIMENS

Defect detection of a semiconductor specimen

Detecting targeted locations in a semiconductor specimen

Detecting defects in a semiconductor specimen

InventorID:

2925981 ⎘