IWAN W. SCHIE

City:

Jena

Country:

Germany

Published Applications:

Last publication date:

2021-03-18

Top Assignees for applications by IWAN W. SCHIE

The entities that hold a legal rights for patent applications filed by inventor SCHIE IWAN W.:

IWAN W. SCHIE from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for examining distributed objects by segmenting an overview image

SYSTEMS, DEVICE AND METHODS PROVIDING A COMBINED ANALYSIS OF IMAGING AND LASER MEASUREMENT

InventorID:

2928183 ⎘