Petach Tikva
Israel
16
2022-03-03
The entities that hold a legal rights for patent applications filed by inventor Batikoff Amit:
Amit Batikoff from Petach Tikva, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
Method of deep learning-based examination of a semiconductor specimen and system thereof
#2 | 2020-01-16Method of inspecting a specimen and system thereof
#3 | 2019-04-25Method of performing metrology operations and system thereof
#4 | 2019-01-24Method of detecting defects in an object
#5 | 2018-11-08Method of inspecting a specimen and system thereof
#6 | 2018-09-20Method of performing metrology operations and system thereof
#7 | 2018-09-20Method of performing metrology operations and system thereof
#8 | 2017-12-21Method of deep learning-based examination of a semiconductor specimen and system thereof
#9 | 2017-12-14Method of deep learning-based examination of a semiconductor specimen and system thereof
#10 | 2017-06-22Method of deep learning-based examination of a semiconductor specimen and system thereof
#11 | 2016-12-01Method of inspecting a specimen and system thereof
#12 | 2016-12-01Method of inspecting a specimen and system thereof
#13 | 2016-09-29Method of inspecting a specimen and system thereof
#14 | 2015-10-29SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATION WITHIN INSPECTION IMAGES
#15 | 2013-12-19System, method and computer program product for detection of defects within inspection images
#16 | 2013-06-27System, method and computer program product for classification within inspection images
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