Bert Freitag

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2025-03-27

Top Assignees for applications by Bert Freitag

The entities that hold a legal rights for patent applications filed by inventor Freitag Bert:

Bert Freitag from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

BLANKER-ENHANCED MOIRE IMAGING

METHOD AND SYSTEM FOR STUDYING SAMPLES USING A SCANNING TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH REDUCED BEAM INDUCED SAMPLE DAMAGE

X-ray detector for electron microscope

X-ray detector for electron microscope

Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus

InventorID:

3129576 ⎘