Mario Laengle

City:

Weimar

Country:

Germany

Published Applications:

Last publication date:

2012-06-28

Top Assignees for applications by Mario Laengle

The entities that hold a legal rights for patent applications filed by inventor Laengle Mario:

Mario Laengle from Weimar, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Mask inspection microscope with variable illumination setting

Method for determining the position of a structure within an image and position measuring device for carrying out the method

InventorID:

3135540 ⎘