Jeffrey O'Dell

City:

Deephaven, Minnesota

Country:

United States

Published Applications:

Last publication date:

2012-04-12

Top Assignees for applications by Jeffrey O'Dell

The entities that hold a legal rights for patent applications filed by inventor O'Dell Jeffrey:

Jeffrey O'Dell from Deephaven, US has applied for patents for these inventions. The list has both pending applications and granted patents:

AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION

Automated wafer defect inspection system and a process of performing such inspection

Automated wafer defect inspection system and a process of performing such inspection

Automated wafer defect inspection system and a process of performing such inspection

InventorID:

3140214 ⎘