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Inventor profile of:

Takayuki INOUE

City:

Atsugi

Country:

Japan

Published Applications:

Last publication date:

2012-05-31

Top Assignees for applications by Takayuki INOUE

The entities that hold a legal rights for patent applications filed by inventor INOUE Takayuki:

SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 10 Atsugi-shi, Japan
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 10 Atsugi-shi, Kanagawa-ken, Japan
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 2 Kanagawa-ken, Japan
Semiconductor Energy Laboratory Co., Ltd. 2 , Japan
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 1 Atsugi, Japan

Recent patent applications by INOUE Takayuki

Takayuki INOUE from Atsugi, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2012-05-31

US20120132719A1

Physics

Semiconductor device

#2 | 2012-05-17

US20120120742A1

Physics

Semiconductor device

#3 | 2011-10-27

US20110261864A1

Physics

Semiconductor device

#4 | 2011-10-13

US20110248268A1

Electricity

Thin film transistor and display device

#5 | 2010-12-02

US20100302887A1

Physics

Semiconductor device

#6 | 2009-09-03

US20090218568A1

Electricity

Thin film transistor and display device

#7 | 2009-01-29

US20090027580A1

Physics

Liquid crystal display device and electronic device

#8 | 2008-09-04

US20080211561A1

Physics

Clock signal generation circuit and semiconductor device

#9 | 2008-07-10

US20080165023A1

Physics

Semiconductor device

#10 | 2008-06-26

US20080151660A1

Physics

Semiconductor device

#11 | 2008-01-03

US20080002454A1

Physics

Semiconductor device and electronic device

#12 | 2008-01-03

US20080001825A1

Physics

Semiconductor device

#13 | 2007-11-29

US20070273522A1

Electricity

Semiconductor device and position detection system using semiconductor device

#14 | 2007-06-28

US20070150250A1

Physics

Parameter setting method and circuit operation testing method and electronic processing device

InventorID:

3168317 ⎘