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Inventor profile of:

Atsuko Takafuji

City:

Nerima-ku

Country:

Japan

Published Applications:

8

Last publication date:

2012-05-31

Top Assignees for applications by Atsuko Takafuji

The entities that hold a legal rights for patent applications filed by inventor Takafuji Atsuko:

  • HITACHI, LTD. 8 Tokyo, Japan

Recent patent applications by Takafuji Atsuko

Atsuko Takafuji from Nerima-ku, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2012-05-31
US20120132801A1
Electricity

Method and an apparatus of an inspection system using an electron beam

#2 | 2009-03-05
US20090057556A1
Electricity

Method and apparatus of an inspection system using an electron beam

#3 | 2007-09-20
US20070215803A1
Electricity

Method and an apparatus of an inspection system using an electron beam

#4 | 2006-07-13
US20060151699A1
Electricity

Method and an apparatus of an inspection system using an electron beam

#5 | 2006-01-26
US20060017014A1
Electricity

Patterned wafer inspection method and apparatus therefor

#6 | 2006-01-17
US10083481
-

Method and an apparatus of an inspection system using an electron beam

#7 | 2005-12-27
US10865850
-

Patterned wafer inspection method and apparatus therefor

#8 | 2005-09-22
US20050205782A1
Electricity

Method and an apparatus of an inspection system using an electron beam

InventorID:

3178564 ⎘

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