Cheng-Chung LEE

City:

Country:

United States

Published Applications:

Last publication date:

2012-06-07

Recent patent applications by LEE Cheng-Chung

Cheng-Chung LEE from , US has applied for patents for these inventions. The list has both pending applications and granted patents:

METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROMETER

METHOD FOR MEASURING THE FILM ELEMENT USING OPTICAL MULTI-WAVELENGTH INTERFEROMETRY

InventorID:

3184709 ⎘