Jena
Germany
10
2012-06-28
The entities that hold a legal rights for patent applications filed by inventor Stroessner Ulrich:
Ulrich Stroessner from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Mask inspection microscope with variable illumination setting
#2 | 2011-10-06Method and apparatus for measuring structures on photolithography masks
#3 | 2011-08-04Method for analyzing masks for photolithography
#4 | 2011-07-07Microscope for reticle inspection with variable illumination settings
#5 | 2010-06-17APPARATUS AND METHOD FOR MEASURING THE POSITIONS OF MARKS ON A MASK
#6 | 2008-12-04Method and device for analysing the imaging behavior of an optical imaging element
#7 | 2008-09-04Method for determining intensity distribution in the image plane of a projection exposure arrangement
#8 | 2006-02-09Polarizer device for generating a defined spatial distribution of polarization states
#9 | 2006-01-19Microscope imaging system and method for emulating a high aperture imaging system, particularly for mask inspection
#10 | 2006-01-12Imaging system for emulation of a high aperture scanning system
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