John Hager

City:

Country:

United States

Published Applications:

Last publication date:

2012-07-12

Top Assignees for applications by John Hager

The entities that hold a legal rights for patent applications filed by inventor Hager John:

John Hager from , US has applied for patents for these inventions. The list has both pending applications and granted patents:

Methods and systems for improved localized feature quantification in surface metrology tools

InventorID:

3213461 ⎘