Hirohiko OBINATA

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2012-08-30

Top Assignees for applications by Hirohiko OBINATA

The entities that hold a legal rights for patent applications filed by inventor OBINATA Hirohiko:

Hirohiko OBINATA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Radiation inspection apparatus

Radiation inspection apparatus comprising a gas ejecting unit for supporting and conveying a sheet-like sample

Radiation inspection apparatus

Orientation meter

InventorID:

3246990 ⎘