Gloucester, Massachusetts
United States
46
2019-06-20
The entities that hold a legal rights for patent applications filed by inventor Notte, IV John A.:
John A. Notte, IV from Gloucester, US has applied for patents for these inventions. The list has both pending applications and granted patents:
CHARGED PARTICLE BEAM SYSTEM AND METHODS
#2 | 2017-02-02Charged particle detecting device and charged particle beam system with same
#3 | 2016-07-14Charged particle beam system and methods
#4 | 2016-04-21Charged particle beam system and method of operating a charged particle beam system
#5 | 2016-04-14Charged particle beam system and method of operating a charged particle beam system
#6 | 2015-07-30Ion sources, systems and methods
#7 | 2015-01-08Charged particle beam system and method of operating a charged particle beam system
#8 | 2015-01-08Charged particle beam system and method of operating a charged particle beam system
#9 | 2015-01-08Charged particle beam system and method of operating a charged particle beam system
#10 | 2015-01-08Charged particle beam system and method of operating a charged particle beam system
#11 | 2015-01-08Charged particle beam system and method of operating a charged particle beam system
#12 | 2014-10-16Ion sources, systems and methods
#13 | 2013-10-03Ion sources, systems and methods
#14 | 2013-07-11Isotope ion microscope methods and systems
#15 | 2012-06-07Ion sources, systems and methods
#16 | 2012-04-26Ion beam stabilization
#17 | 2011-10-06Ion sources, systems and methods
#18 | 2011-06-16Isotope ion microscope methods and systems
#19 | 2011-06-02ELECTRON DETECTION SYSTEMS AND METHODS
#20 | 2011-05-26Sample inspection methods, systems and components
#21 | 2011-03-03Reducing particle implantation
#22 | 2011-01-06Gas field ion source with coated tip
#23 | 2010-06-03ICE LAYERS IN CHARGED PARTICLE SYSTEMS AND METHODS
#24 | 2010-03-04Ion beam stabilization
#25 | 2010-01-21Increasing current in charged particle sources and systems
#26 | 2010-01-21Multiple current charged particle methods
#27 | 2009-12-24Sample decontamination
#28 | 2009-07-16Ion sources, systems and methods
#29 | 2009-05-07Ion sources, systems and methods
#30 | 2008-05-15Determining dopant information
#31 | 2007-09-27Ion sources, systems and methods
#32 | 2007-09-20Systems and methods for a gas field ion microscope
#33 | 2007-09-13Ion sources, systems and methods
#34 | 2007-09-13Ion sources, systems and methods
#35 | 2007-09-06Ion sources, systems and methods
#36 | 2007-08-23Ion sources, systems and methods
#37 | 2007-08-23Ion sources, systems and methods
#38 | 2007-08-16Ion sources, systems and methods
#39 | 2007-07-12Ion sources, systems and methods
#40 | 2007-07-12Ion sources, systems and methods
#41 | 2007-07-12Ion sources, systems and methods
#42 | 2007-07-12Ion sources, systems and methods
#43 | 2007-07-12Ion sources, systems and methods
#44 | 2007-07-12Ion sources, systems and methods
#45 | 2007-07-12Ion sources, systems and methods
#46 | 2007-06-21Ion sources, systems and methods
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