Changting Wang

City:

Schenectady, New York

Country:

United States

Published Applications:

Last publication date:

2011-01-06

Top Assignees for applications by Changting Wang

The entities that hold a legal rights for patent applications filed by inventor Wang Changting:

Changting Wang from Schenectady, US has applied for patents for these inventions. The list has both pending applications and granted patents:

METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES

PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTIONAL EDDY CURRENT PROBE

EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS

Eddy current probe and inspection method

Eddy current array probes with enhanced drive fields

Method and apparatus for node electronics unit architecture

Omnidirectional eddy current probe and inspection system

Method and apparatus for optimized centralized critical control architecture for switchgear and power equipment

Methods and apparatus for inspection utilizing pulsed eddy current

InventorID:

3328003 ⎘