Jason Mark Thelander

Pressure tester for printhead integrated circuit carrier

#2 | 2011-06-23

US20110149355A1

IMAGING APPARATUS FOR IMAGING INTEGRATED CIRCUITS ON AN INTEGRATED CIRCUIT CARRIER

#3 | 2011-02-24

US20110043586A1

Continuous web printer with flat print zones for printing opposing sides of the web

#4 | 2011-02-24

US20110043585A1

Continuous web printer with upper and lower print zones for opposing sides of web

#5 | 2011-02-24

US20110043584A1

CONTINUOUS WEB PRINTER WITH PAGEWIDTH PRINTHEAD IN A PRINTHEAD DRAWER

#6 | 2011-02-24

US20110043583A1

Continuous web printer with air platen

#7 | 2011-02-24

US20110043582A1

CONTINUOUS WEB PRINTER WITH AUTOMATED WEB THREADING MECHANISM

#8 | 2011-02-24

US20110043581A1

WEB PRINTER WITH DUAL PRINT ZONES HAVING OPPOSING FEED DIRECTIONS

#9 | 2011-02-24

US20110043580A1

Continuous web printer with short media feed path

#10 | 2011-02-24

US20110043554A1

Continuous web printer for printing non-identical copies within a print run

#11 | 2010-02-25

US20100049464A1

SYSTEM FOR TESTING INTEGRATED CIRCUITS

#12 | 2010-02-25

US20100047962A1

MULTI-CHIP PRINTHEAD ASSEMBLER

#13 | 2010-02-25

US20100047053A1

DIE PICKER FOR PICKING PRINTHEAD DIE FROM A WAFER

#14 | 2010-02-25

US20100047052A1

Wafer positioning system

#15 | 2010-02-25

US20100047044A1

Placement head for a die placing assembly

#16 | 2010-02-25

US20100047043A1

Integrated circuit placement system

#17 | 2010-02-25

US20100046007A1

Measuring apparatus for performing positional analysis on an integrated circuit carrier

#18 | 2010-02-25

US20100045986A1

Imaging apparatus for imaging integrated circuits on an integrated circuit carrier

#19 | 2010-02-25

US20100045730A1

Method for testing integrity of a base for printhead integrated circuitry

#20 | 2010-02-25

US20100045729A1

METHOD FOR TESTING ALIGNMENT OF A TEST BED WITH A PLURALITY OF INTEGRATED CIRCUITS THEREON

#21 | 2010-02-25

US20100045458A1

SAFETY SYSTEM FOR AN INTEGRATED CIRCUIT ALIGNMENT TESTING APPARATUS

#22 | 2010-02-25

US20100045330A1

Apparatus for testing integrated circuitry

#23 | 2010-02-25

US20100045315A1

Diagnostic probe assembly for printhead integrated circuitry

#24 | 2010-02-25

US20100045313A1

Method for testing integrated circuits mounted on a carrier

#25 | 2010-02-25

US20100044437A1

MEASURING APPARATUS FOR A CARRIER OF PRINTHEAD INTEGRATED CIRCUITRY

#26 | 2010-02-25

US20100043980A1

ALIGNMENT MECHANISM FOR ALIGNING AN INTEGRATED CIRCUIT

#27 | 2010-02-25

US20100043979A1

BONDING APPARATUS FOR PRINTHEADS

#28 | 2010-02-25

US20100043977A1

LAMINATING APPARATUS FOR A PRINTHEAD CARRIER SUB-ASSEMBLY

#29 | 2010-02-25

US20100043960A1

METHOD FOR LAMINATING A CARRIER FOR PRINTHEAD INTEGRATED CIRCUITRY

#30 | 2010-02-25

US20100043536A1

Cradle assembly for a pressure decay leak tester

#31 | 2010-02-25

US20100043535A1

Leak tester for a carrier for printhead integrated circuitry

#32 | 2010-02-25

US20100043534A1

Pressure-based tester for a platform assembly

#33 | 2010-02-25

US20100043533A1

Pneumatic assembly for a pressure decay tester

#34 | 2010-02-25

US20100043224A1

Method of attaching integrated circuits to a carrier

#35 | 2010-02-25

US20100043215A1

Clamp assembly for an assembler of integrated circuitry on a carrier

#36 | 2010-02-25

US20100043214A1

INTEGRATED CIRCUIT DICE PICK AND LIFT HEAD

#37 | 2010-02-25

US20100043213A1

Transfer apparatus for transferring a component of integrated circuitry

#38 | 2008-11-20

US20080283198A1

DIE PICKER WITH HEATED PICKING HEAD

#39 | 2008-11-20

US20080283197A1

DIE PICKER WITH LASER DIE HEATER

#40 | 2008-11-20

US20080283190A1