Teodor Gotszalk

City:

Wroclaw

Country:

Poland

Published Applications:

Last publication date:

2011-02-24

Top Assignees for applications by Teodor Gotszalk

The entities that hold a legal rights for patent applications filed by inventor Gotszalk Teodor:

Teodor Gotszalk from Wroclaw, PL has applied for patents for these inventions. The list has both pending applications and granted patents:

Apparatus and method for investigating surface properties of different materials

Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques

InventorID:

3347198 ⎘