Mark M. Bahn

City:

Rochester, Minnesota

Country:

United States

Published Applications:

Last publication date:

2011-03-17

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Mark M. Bahn from Rochester, US has applied for patents for these inventions. The list has both pending applications and granted patents:

System and method for phase offset and time delay correction in magnetic resonance spectroscopy data

InventorID:

3359059 ⎘