Ishikawa
Japan
6
2011-04-21
The entities that hold a legal rights for patent applications filed by inventor Ando Toshio:
Toshio Ando from Ishikawa, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Scanner device for scanning probe microscope
#2 | 2010-01-28Atomic force microscope
#3 | 2009-12-17Scan type probe microscope and cantilever drive device
#4 | 2009-11-05Scanning probe microscope and active damping drive control device
#5 | 2009-05-21Scanning probe microscope
#6 | 2008-12-18Scan type probe microscope
3370531 ⎘