Boise, Idaho
United States
17
2013-11-07
The entities that hold a legal rights for patent applications filed by inventor Williamson Mark J.:
Mark J. Williamson from Boise, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Method for integrated circuit diagnosis
#2 | 2013-07-18Profiling solid state samples
#3 | 2011-06-16APPARATUS AND SYSTEMS FOR INTEGRATED CIRCUIT DIAGNOSIS
#4 | 2011-03-10ELECTRON BEAM ETCHING DEVICE AND METHOD
#5 | 2011-01-27Electron induced chemical etching and deposition for local circuit repair
#6 | 2010-12-23Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging
#7 | 2010-12-16Profiling solid state samples
#8 | 2010-09-02Electron beam processing device and method using carbon nanotube emitter
#9 | 2009-11-26PLASMA AND ELECTRON BEAM ETCHING DEVICE AND METHOD
#10 | 2008-02-14Plasma and electron beam etching device and method
#11 | 2008-02-14Electron beam etching device and method
#12 | 2008-02-14Electronic beam processing device and method using carbon nanotube emitter
#13 | 2008-02-14Profiling solid state samples
#14 | 2008-01-10Electron induced chemical etching for device level diagnosis
#15 | 2008-01-10Electron induced chemical etching/deposition for enhanced detection of surface defects
#16 | 2008-01-10Electron induced chemical etching and deposition for local circuit repair
#17 | 2007-12-06ELECTRON INDUCED CHEMICAL ETCHING FOR MATERIALS CHARACTERIZATION
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